CERN will be present at the IEEE conference on Nuclear Science Symposium and Medical Imaging Conference 2016 (NSS/MIC) in Strasbourg, France, 29th October to 5th November. CERN will have a strong presence related to its contribution to High Energy Physics, medical imaging, health and safety, and knowledge transfer and industry. An institutional booth will showcase CERN’s activities in science, technology and knowledge transfer.
CERN will actively contribute to both NSS and MIC, presenting results and chairing sessions, including plenary sessions chaired by Eckhard Elsen, CERN Director for Research and Computing. CERN’s contributions will include talks about the European Open Science Cloud, High Luminosity LHC upgrade (HL-LHC) and the FCC as well as its expertise in fields ranging from scintillating crystals, to silicon photomultipliers and dosimetry and the latest results from several CERN experiments.
On the NSS side, the programme covers the latest developments in instrumentation and data processing in fields ranging from particle physics to radiation therapy, and will bring together scientists and engineers alike. On the other side, MIC is a unique international scientific meeting on the physics, engineering and mathematical aspects of nuclear medical imaging. This year’s event will cover hardware and software developments both in multimodality imaging and radiation therapy.
An Academia/Industry Matching Forum will be organised on Tuesday November 1st, jointly by CERN and CEA (the French Commissary for Atomic Energy and Alternative Energies). CERN will also have an institutional booth, presenting CERN’s activities in science and knowledge transfer through its contribution to industry and medical imaging.
The Strasbourg event is also being held in conjunction with the 23rd International Symposium on Room-Temperature Semiconductor Detectors (RTSD), which represents the largest forum for semiconductor radiation detectors and imaging arrays.
Further details on the extensive programme can be found at 2016.nss-mic.org.